|C H A P T E R 4|
Using the SunVTS CDE User Interface
This chapter describes how to run a test session using the SunVTS CDE UI. The procedures are written in a step-by-step form so you can use them to become familiar with SunVTS using the SunVTS CDE UI. This chapter is divided into the following sections:
Note - This chapter assumes that you have already performed the following procedures:
See Appendix A for descriptions of each SunVTS window and dialog box.
This section describes how to use the fundamental features of the SunVTS CDE UI to perform diagnostic testing on a system. For information about using more advanced features, see Using Additional Features With the SunVTS CDE UI.
When you start the SunVTS CDE user interface, the SunVTS CDE main window is displayed (FIGURE 4-1). SunVTS is in an idle state with all testing options set to default values.
Note - See Appendix A for details about each main window item.
1. Identify the current state of SunVTS in the Status panel (FIGURE 4-2).
AC Coverage--displays the type of Auto Configuration coverage level that was selected (either confidence, comprehensive, or no_coverage when the AC feature is not in use).
2. Select a test mode from the Test Mode panel (FIGURE 4-3):
Connection test mode--provides a low-stress, quick testing of the availability and connectivity of selected devices. These tests are non-intrusive, meaning they release the devices after a quick test, and they do not place a heavy load on system activity.
Auto Config test mode--opens the Automatic Configuration dialog box which provides access to the Automatic Configuration feature. The Automatic Configuration feature simplifies the test session configuration by assigning a predetermined set of test options. See Using the Automatic Configuration Feature for instructions on using this feature.
The devices that SunVTS identified as testable devices on your system are listed in the System Map (FIGURE 4-6). You control the way that SunVTS displays these devices by selecting one of the following:
Logical Mapping--organizes the devices, according to their function, into groups. For example, SCSI disk, SCSI tape, and SCSI CD-ROM drives are placed in the SCSI-Devices group. You can focus your testing on a specific device, device group, or on all of the groups on the system.
Physical Mapping--shows the exact location of each device on the system in relation to how the devices are connected to each other. If you are testing a single-board type system, each device is shown under the system board. Multi-board type systems show each device under the board (for example, board0, board1, and so on) to which the device is attached. For example, if you have multiple disk drives connected to different disk interfaces, each disk would be displayed under the respective interface. From Physical Mapping, you can determine the actual location of each device. When possible, the board number and controller type for the device are also displayed.
When SunVTS is started, most of the devices in the System Map are collapsed, meaning individual devices are grouped together and hidden from view under a device category. A "+" (plus) indicates that the device group is collapsed. A "-" (minus) indicates that the device group is expanded so you see each device for a given category.
A checkmark next to a device in the System Map indicates that device is selected. Depending on the devices on your system, and the test mode that you select, SunVTS selects certain devices by default.
Note - Any device that requires your intervention before the test can run (such as loading media for tape, CD-ROM, and diskette tests), also requires that you notify SunVTS that you have performed this action by selecting the Intervention checkbox. You cannot select any intervention mode tests until you select this checkbox.
SunVTS is ready to test each device once you select it. There are, however, testing options that you can modify that alter the way tests run to suit your testing needs. There are three levels where you control test options:
System-level options--control the testing attributes of all devices. This is the highest level, applying all your options globally. When you modify options at this level, the option settings are propagated down to the group-level and device-level options.
Group-level options--control the testing attributes of all the devices in the group. Settings made at this level propagate down, setting all the options in the levels in the group.
The order that you apply the system-level, group-level, and device-level options is important. Start by assigning the system-level options, then assign the group-level options, and finish with the device-level options. Otherwise, if you make lower-level option settings, then higher level option settings, the higher-level settings will propagate down and undo your lower-level settings. An alternative to this approach is to use locks and overrides to protect lower level settings. See Preserving Test Options with Locks and Overrides.
Note - System-level, group-level, and device-level options are only available when Functional Test Mode is selected. Most of these options are grayed-out and not available for Connection Mode testing.
Access the system-level options from the Options menu in the Menu Bar (FIGURE 4-8).
Test Execution Options--allows you to define how a test session runs. For example, you can set the Max errors value to define the maximum number of allowable errors before stopping the test (0=continue to run on infinite errors).
Advanced--provides overrides and locks that control which option settings (system-level, group-level, or device-level) take precedence.
Note - These dialog boxes are described in detail in Appendix A.
Note - To increase or decrease a numeric value in a SunVTS CDE dialog box, you can either use the up or down arrows, or type a new value in the text box and press Return. Press Apply to apply all dialog box changes.
A menu appears offering access to the following dialog boxes (FIGURE 4-9):
Test Parameter Options--Shows device configuration information and provides the controls for defining specific test options. This menu is different for each kind of test. For example, the Test Parameter Options for the memory test (pmemtest) allow you to specify the amount of memory to test, while the network test (nettest) provides a setting to define a target host for test packets. Refer to the SunVTS Test Reference Manual for descriptions of all the Test Parameter Options. Once you change a Test Parameter Option, apply the change to the desired level:
See Test Parameter for more information.
Test Execution Options--allows you to define how a test runs. For example, you can set the Max errors value to define the maximum number of allowable errors before stopping the test (0=continue to run on infinite errors). The options in this menu are the same for each kind of test.
Test Advanced Options--Provides a setting to "lock" the option settings for an individual device so that the system level setting will not affect the option setting for this test. See Preserving Test Options with Locks and Overrides for more details.
Note - For descriptions of the options presented in these dialog boxes see, SunVTS Dialog Boxes.
A test error is detected (this is the default behavior). If you enter a value for Run On Error, SunVTS continues to run until the specified number of errors is reached.
Testing has reached the Max Passes value. The default is to run indefinite test passes. When individual test passes are complete, SunVTS continues to display the status testing for 5 seconds. If you do not select additional devices to test in the 5 second interval, SunVTS enters an idle state.
An asterisk--displayed next to each device indicating the device that is currently under test. Depending on how you configured SunVTS (with the System Concurrency option), single or multiple devices are tested concurrently.
If you enable trace mode (from the CommandsTrace test menu bar selection) and set the trace to display in the window, all of the test system calls are displayed.
SunVTS kernel error log - contains time-stamped SunVTS kernel and SunVTS probe errors. SunVTS kernel errors are errors that relate to running SunVTS, and not to testing of devices. The log file pathname is /var/opt/SUNWvts/logs/vtsk.err. This file is not created until SunVTS reports a SunVTS kernel error.
SunVTS information log--contains informative messages that are generated when you start and stop SunVTS test sessions. The log file pathname is
/var/opt/SUNWvts/logs/sunvts.info. This file is not created until a SunVTS test session runs.
There are many messages for each of the many tests that run under SunVTS. For this reason, it is difficult to document the implication of each message that you might see. Most messages contain all the explanatory text that is possible for each event that is encountered. Some messages are information messages (INFO, VERBOSE, WARNING) which do not represent an error, and some messages are error messages (ERROR and FATAL), indicating that the test detected a failure. This section explains generic test message information.
Whenever possible, the error message supplies a message type (as shown in the following table), followed by the message text, one or more probable causes, and one or more recommended corrective actions.
You can write scripts that watch for certain SunVTS events as they are logged in the log files, and which trigger an action when a particular message string occurs. If you plan to do this, refer to the following table of SunVTS message syntax and descriptions.
Note - As of SunVTS 5.0, the VTS_OLD_MSG variable is no longer supported. It was used to display test messages in a pre-SunVTS 4.0 format, usually because a script relies on the older format. Now your scripts must accept the current SunVTS message formtat.
When you are done reviewing the information in the main window, you can clear the current results by clicking on the Reset button. This resets the information in the Status panel. This does not reset your test options.
Consistent testing--as you test the system from time to time, you know that the same test options are applied. You also get diagnostic consistency when you test multiple systems of the same platform type.
Time Saving--You can select the Automatic Configuration feature without manually setting the options and start testing right away.
The Automatic Configuration dialog box is displayed (FIGURE 4-10).
Comprehensive--sets all the test options for thorough testing. All applicable functional tests are enabled. The test session validates the full functionality of the system and provides you with assurance that the system is hardware fault free.
Confidence--sets all the test options such that there is limited functional test coverage as compared to the Comprehensive level of coverage. The Confidence level testing verifies the main functionality of the system in a shorter amount of time.
The test session runs with the predetermined set of options based on the level of coverage (comprehensive or confidence) that you selected. The AC Coverage (Confidence or Comprehensive) is displayed in the Status panel.
You can connect the SunVTS user interface on your local system to a SunVTS kernel that is running on another system in your network. Once you are connected to the remote system, all of the controls in the CDE UI control the testing of the remote system.
Enter the hostname in the Connect to Host field. As you connect to various remote systems, SunVTS keeps track of those systems and displays them in the Hostname List. You can reconnect to one of those hosts by double-clicking on the host name in this list. This list is only maintained during your current SunVTS session. When you quit SunVTS, the Hostname List is cleared.
The log file sizes of the SunVTS test error log (/var/opt/SUNWvts/logs/sunvts.err), the SunVTS kernel error log (/var/opt/SUNWvts/logs/vtsk.err) and the information log (/var/opt/SUNWvts/logs/sunvts.info) are each limited to a maximum size of 1 Mbyte by default. When the log file reaches the maximum size, the content is moved to a file called logfilename.backup. Additional events are added to the main log files. If the log file reaches the maximum size again, the content is moved to the backup file, overwriting the earlier backup file content. Only one backup file is maintained for each log file.
You can use the Trace test option to create a log of every system call made when a test is running. This feature logs the system calls using the standard UNIX command truss. The trace messages logged by this feature give you a powerful debugging tool for isolating the specific cause of an error.
When you select a test, system call tracing is enabled immediately. If the test is already running when you select it, tracing begins immediately and the trace test messages appear in the SunVTS console window.
Note - When using the Physical map view, you can only see one level in the hierarchy (such as one controller on a system board). Therefore, some devices that are several levels down are not available to trace. Use the Logical view to select tracing for these devices.
With locks and overrides you can preserve or override the options you set at the system level, group-level, and device-level (see Modify the system-level test options (if desired).).
Normally, when you change an option setting at the system level or group-level, the new option setting propagates down to all lower levels. Enabling the lock prevents an option setting made at a higher level from affecting the lower-level option setting.
You can use a combination of options to scale (increase or decrease testing intensity) to meet your diagnostic needs. For example, you can modify test options so that each test instance runs simultaneously, thus increasing the stress level for a single or multiprocessor system. The following procedures can be used individually or in combination to scale the test session.
You can scale your test session by running multiple copies of the same test on your devices. Each copy is call a test instance. Each test instance is a separate process of the same test. The number of test instances can be set at the system level, group level, and the device level as follows:
Device level--place your pointer over the device and right-click. Then select Test Execution Options.
The test concurrency option sets the number of tests that run at a given time during a test session. You can set this value to one to run one test at a time, or increase the test concurrency value thus increasing the stress level of your test session.
By default, the Solaris kernel assigns each test instance to whichever processor is available at the time. On multiprocessor systems, you can bind (assign) a test instance to a particular processor as follows:
Device-level--place your pointer over the device and right-click. Then select Test Execution Options.
Note - The Processor Affinity option is not available for processor tests such as cputest and fputest. These tests are associated with each individual processor on your system and you cannot bind these tests to a different processor.
By default, the test instances are not bound to any processor. You can either keep this unbound or select a specific processor to bind or select option for "sequential" binding. Selecting the "sequential" option binds the test instance(s) to different processors in the system as the test instances are created. Even if there is a higher number of processors than instances, the sequential binding will eventually bind the test instances to all the processors in subsequent test passes.
You can enable certain options that cause the SunVTS test session to output more test data than when you run the session with the default option values. The following procedures describe how to enable these features.
Device-level--place your pointer over the device and right-click. Then select Test Execution Options.
Verbose--displays verbose messages indicating when the test is starting and stopping during the test session.
Core File--when enabled, creates a core file when a test session results in a core dump. The core file is called sunvts_install_dir/bin/core.testname.xxxxxx , where testname is the test that dumped the core, and xxxxxx is a character string generated by the system in order to make the file name unique.
Note - The Trace feature also provides additional test data. See Tracing a Test.
You can use the Option Files feature to save the current set of selected devices and test options for reuse. This is a convenient feature when you plan to perform the same test session configuration repeatedly.
The option file could be saved in host-dependent format or host-independent generic option format. If the option file is stored in host-dependent format, it can be used on other hosts only if the device configurations match. Alternately, the generic option format is designed to work on multiple hosts with different device configurations. The generic option format may save one set of options for one test which can then be applied to all devices (irrespective of the number of devices) for that test in that machine or other machines. Note that this feature is useful when the number of devices of a specific test is machine-dependent.While saving the configuration in host-independent generic option format, select at most, one device per device type. If multiple devices of similar type have been selected, any one device will be chosen automatically for being saved. When the same option file is loaded, all devices of that device type will be selected and configured with the same test options.The host-independent option file could be saved for either normal load or cumulative load. The cumulative generic option file can be used to do incremental configuration by loading one after another. Loading a cumulative option file does not deselect already selected test devices. Alternately, loading of a non-cumulative option file first deselects all tests, then only selects the devices that are defined in the option file.
The option file contains information about system level options and test level options. Option file creation is primarily intended to be done from a GUI. However, you can edit option files with any text editor to accomodate specific needs, if needed. See Appendix C for information on editing generic option files.
You can use the auto-start feature, along with saved option files, to simplify the process of configuring a test session and running it.When the auto-start feature is turned on in an option file, SunVTS automatically starts the test session when the option file in invoked, eliminating the need to select the start button.
3. Create an option file as described in To Create an Option File.
The kernel reruns the same tests, with the same configuration that you specified in Step 1.
SunVTS provides a Deterministic Scheduler that you can use to define what tests run and in what order. If you do not use this feature, selected tests run in an order that is dynamically determined by SunVTS kernel.
Start SunVTS with the SunVTS CDE user interface.
Start the Deterministic Scheduler.
Start the sequence.
When the sequence is done, reset the Deterministic Scheduler if desired.
Quit the Deterministic Scheduler feature.
1. Start SunVTS with the SunVTS CDE user interface as described in Starting SunVTS.
The Deterministic Scheduler Dialog box is displayed (FIGURE 4-11).
Note - When you start the Deterministic Scheduler, many of the commands from the main SunVTS window such as Start, Stop, Resume, Suspend, Record, Replay, Load, and Set are not permitted. When you stop the Deterministic Scheduler, these SunVTS features become functional.
The Deterministic Scheduler displays the Task Manager panel and shows a list of existing tasks (if any have been created) in the Available Tasks list. You can use existing tasks or create new tasks. If this is the first time that the Deterministic Scheduler is used, you must create your own.
When the Deterministic Scheduler is started, it changes the default values of Max System Passes from 0 (run indefinitely) to 1 (run one pass). This is necessary so that each task only runs selected tests once and proceeds to run subsequent tasks in the sequence.
The right-hand panel displays the Sequence Runner panel (FIGURE 4-14), providing access for you to define the number of times (loops) for the sequence to run and to start running the sequence.
monitor the test progress in the main SunVTS window. All test results are logged in the SunVTS log files.
close the Deterministic Scheduler dialog box by pressing the close button or by selecting CommandsQuit OptionsQuit UI only from the Deterministic Scheduler dialog box. Testing will continue, and results will be displayed in the SunVTS main window. You can reopen the Deterministic Scheduler dialog box from the SunVTS main window.
suspend and resume the sequence by pressing the suspend and resume buttons in the Deterministic Scheduler dialog box.