A driver's ability to handle multiple configurations is as important part of the test process. Once the driver is working on a simple, or default, configuration, additional configurations should be tested. Depending upon the device, this may be accomplished by changing jumpers or DIP switches. If the number of possible configurations is small, all of them should be tried. If the number is large, various classes of possible configurations should be defined, and a sampling of configurations from each class should be tested. The designation of such classes depends on how the different configuration parameters might interact, which in turn depends on the device and on how the driver was written.
For each configuration, the basic functions must be tested, which include loading, opening, reading, writing, closing, and unloading the driver. Any function that depends upon the configuration deserves special attention. For example, changing the base memory address of device registers is not likely to affect the behavior of most driver functions; if the driver works well with one address, it is likely to work as well with a different address, provided the configuration code enables it to work at all. On the other hand, a special I/O control call might have different effects depending upon the particular device configuration.
Loading the driver with varying configurations ensures that the probe(9E) and attach(9E) entry points can find the device at different addresses. For basic functional testing, using regular UNIX commands such as cat(1) or dd(1M) is usually sufficient for character devices. Mounting or booting may be required for block devices.