SunVTS 3.0 Test Reference Manual

afbtest Command Line Syntax

/opt/SUNWvts/bin/afbtest standard_arguments -o dev=device_name, S=subtest_number,F=#_of_subtest_loops,B=#_of_test_loops,P=test_pattern

Table 2-2 afbtest Command Line Syntax




device_name is the relative path name of the device being tested with respect to /dev/fbs; The default is afb0.


subtest_number is the test number of the subtest to be run. Select from the subtests below. You can run multiple subtests by adding the subtest numbers together. For example, n=0x3 runs both test 1 and test 2; n=0x180 runs both test 0x080 and test 0x0100. You do not need the leading zeros.

n - 0x00001 3DRAM

n - 0x00002 3DRAM Logic

n - 0x00004 RAMDAC

n - 0x00008 Micro code

n - 0x00010 Rendering Pipeline

n - 0x00020 FastFill/Vertical Scroll

n - 0x00040 Pixel Processor

n - 0x00080 AFB Dots

n - 0x00100 AFB Lines

n - 0x00200 AFB Triangles

n - 0x00400 Lighting

n - 0x00800 Texture Processor

n - 0x02000 AFB Mix Test

n - 0x04000 Picking

n - 0x08000 Arbitration

n - 0x10000 Stereon - ox40000 UART


The number of times to repeat each subtest; the default is 1. 


The number of times to repeat a test loop before passing; the default is 1. 


The test pattern number. The default is r, for random patterns. You may also choose 0 for 0x0000000, 3 for 0x3333333, 5 for 0x5555555, or 9 for 0x9999999.

Note -

64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If the test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to "32-Bit and 64-Bit Tests".