SunVTS 3.0 Test Reference Manual

tcxtest Command Line Syntax

/opt/SUNWvts/bin/tcxtest standard_arguments -o dev=device_name,lock=E(nable)/D(isable), X=bit_mode,T=test,S=[dfb8, dfb24, dfb32]

Table 41-2 tcxtest Command Line Syntax

Argument 

Explanation 

dev=device_name

Specifies the filename of the device to be tested, for example: dev=tcx0.

lock=E(nable)/D(isable)

Enables or disables the window system locking option. See the section about Testing Frame Buffers in SunVTS 3.0 User's Guide for details. Do not use when device is the window system display.

X=bit_mode

Specifies the data transfer size; supported values are: 

 

8 byte 16 short 32 long 64 double word

T=test

Specifies a particular test; to specify an individual test, replace test with:

 

a =Address c =Constant r =Random b =Blit s =Stipple h =Cursor w =WRC

Note: When you select either the Blit or Stipple test, both the User and Raw mode tests are run.

S=[dfb8, dfb24, dfb32]

Specifies which frame buffer memory space to use. 

-dfb8 Dumb frame buffer 8-bit space. Memory is accessed only by bytes.

-dfb24 Dumb frame buffer 24-bit space. Memory is accessed only by 24-bit reads and writes.

-dfb32 Dumb frame buffer 8-bit space. Memory is accessed by 8-bit reads and writes.


Note -

64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to "32-Bit and 64-Bit Tests".