A driver's ability to handle multiple device configurations is an important part of the test process. Once the driver is working on a simple, or default, configuration, additional configurations should be tested. Depending on the device, configuration testing can be accomplished by changing jumpers or DIP switches. If the number of possible configurations is small, all configurations should be tried. If the number is large, various classes of possible configurations should be defined, and a sampling of configurations from each class should be tested. Defining these classes depends on the potential interactions among the different configuration parameters. These interactions are a function of the type of the device and the way in which the driver was written.
For each device configuration, the basic functions must be tested, which include loading, opening, reading, writing, closing, and unloading the driver. Any function that depends upon the configuration deserves special attention. For example, changing the base memory address of device registers is not likely to affect the behavior of most driver functions. If a driver works well with one address, that driver is likely to work as well with a different address. On the other hand, a special I/O control call might have different effects depending on the particular device configuration.
Loading the driver with varying configurations ensures that the probe(9E) and attach(9E) entry points can find the device at different addresses. For basic functional testing, using regular UNIX commands such as cat(1) or dd(1M) is usually sufficient for character devices. Mounting or booting might be required for block devices.