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C H A P T E R  4
Blade Support Chip Test (bsctest)

 


caution icon Caution - The bsctestexercises the Blade Support Chip and supporting hardware used in Sun FiretrademarkB100 blade systems. This includes the OpenBoottrademarkPROM and Time of Day (ToD) PROM chips.


caution icon Caution - If the LED subtest is selected, LEDs on the blade will change. The LEDs will return to their correct state when the test is completed.

bsctest Options

To reach the following dialog box, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups, or your system might not include the device appropriate to this test. Refer to the SunVTS User's Guide for more details.


Screenshot of the bsctest Test Parameter Options dialog box

FIGURE 4-1 bsctestTest Parameter Options Dialog Box


TABLE 4-1 bsctest Options

bsctestOptions

Description

BSCSelfTests

Calls on the BSC to execute its built-in self-tests.

PSU

Performs read-only checks of power supply status.

Fan

Performs read-only checks of fan status.

Temp

Performs read-only checks of temperature monitor status.

ToD

Performs read-only checks of Time of Day chip.

OBP

Performs read-only checks of platform specific OpenBoot properties.

EEPROM

Performs read-only check of EEPROM.

LED

Performs read-only check of Service Required LED status, and performs a test in which all three LEDs (Power, Service Required, and Ready to Remove) are flashed simultaneously at 4Hz and then returned to their original state.


bsctest Test Modes


TABLE 4-2 bsctest Supported Test Modes

Test Mode

Description

Connection

Opens the BSC, OBP, and ToD devices.

Functional

Performs all tests with the LED testing off by default.

Online

Performs all tests except BSCSelfTests and LED Flashing test.


bsctest Command-Line Syntax

/opt/SUNWvts/bin/bsctest standard_arguments [-o dev=device_name test=test_list]]


TABLE 4-3 bsctest Command-Line Syntax

Argument

Description

dev=device-name

device_name is the device to be tested, for example, bsc.

test=test-list

test-list is the list of subtests, for example, BSCSelfTests, PSU, Fan, Temp, ToD, OBP, EEPROM, LED.




SunVTS 6.4 Test Reference Manual for SPARC Platforms 820-1670-10 Table Of ContentsPrevious ChapterNext ChapterBook Index


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