afbtest Command-Line Syntax
/opt/SUNWvts/bin/afbtest standard_arguments -o dev=device_name, S=subtest_number,F=#_of_subtest_loops,B=#_of_test_loops,P=test_pattern
Table 2-3
afbtest Command-Line
Syntax
Argument
|
Description
|
dev=device_name
|
device_name is the relative path name of the device being tested with respect to /dev/fbs; The default is afb0.
|
S=subtest_number
|
subtest_number is the test number of the subtest to be run. Select from the subtests below. You can run multiple subtests by adding the subtest numbers together. For example, n=0x3 runs both test 1 and test 2; n=0x180 runs both test 0x080 and test 0x0100. You do not need the leading zeros.
-
n--0x00001
3DRAM
-
n--0x00002
3DRAM Logic
-
n--0x00004
RAMDAC
-
n--0x00008
Micro code
-
n--0x00010
Rendering Pipeline
-
n--0x00020
FastFill/Vertical Scroll
-
n--0x00040
Pixel Processor
-
n--0x00080
AFB Dots
-
n--0x00100
AFB Lines
-
n--0x00200
AFB Triangles
-
n--0x00400
Lighting
-
n--0x00800
Texture Processor
-
n--0x02000
AFB Mix Test
-
n--0x04000
Picking
-
n--0x08000
Arbitration
-
n--0x10000
Stereo
-
n--0x40000
UART
|
F=#_of_subtest_loops
|
The number of times to repeat each subtest. The default is 1.
|
B=#_of_test_loops
|
The number of times to repeat a test loop before passing. The default is 1.
|
P=test_pattern
|
The test pattern number. The default is r, for random patterns. You may also choose 0 for 0x0000000, 3 for 0x3333333, 5 for 0x5555555, or 9 for 0x9999999.
|
Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If the test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to "32-Bit and 64-Bit Tests".
Note - Errors returned by afbtest are nonspecific: It is not possible to determine which component caused a failure. In all error conditions, the field replaceable unit (FRU) is the entire AFB.