test

SunVTS 3.0 Test Reference Manual

Chapter 31 Environmental Sensing Card Test (sentest)

sentest checks the SCSI Environmental Sensing card (SEN) installed in the SPARCstorage RSM to monitor the enclosure environment. The SEN card monitors the enclosure's over-temperature condition, fan-failures, power-supply failures, and drive activity.

sentest verifies the SEN card by first setting each control function to a predetermined value, and then reading it back to verify if the value is correct.

sentest verifies the following control functions in the enclosure:

sentest is a nonscalable test. It cannot verify the control function settings correctly if another instance is changing the setting.

sentest Options

Figure 31-1 sentest Options Menu

Graphic

Table 31-1 sentest Options

sentest Option

Description 

Test Type 

Specifies the test to be performed. Norm test type performs normal testing as alarm enable/disable, alarm time setting, and drive LED on/off testing; Interactive test type reports the current enclosure status.

Enc_state 

Specifies which subsystem's status in the enclosure is reported. Default is ALL. This test is only used with the inter test type and in Functional test. The test options are: 

oAlarm enable/disable status  

oDrive present status 

oDrive LED status 

oPower modules status 

oFan modules status 

oOver temperature, abs (abnormal, no immediate attention needed), chk (abnormal, immediate attention needed) status 

oAll of the above 

sentest Test Modes

sentest supports all three test modes. Each mode performs a different test scheme on the SEN card.

Table 31-2 sentest Test Modes

Test Mode 

Description 

Connection Test 

Checks the device connection by opening the device. If the device does not open, the device is not connected. 

Functional Test 

Checks three components within the enclosure. It checks alarm enable/disable, alarm time setting, and the drive LEDs. It does not test the power on/off function (only functions whose values can be changed are tested). 

Online Mode 

Provides a means to run sentest through SyMON. In Online mode, the following Functional Test description applies: sentest opens the device and reports the current enclosure status.

sentest Command Line Syntax

/opt/SUNWvts/bin/sentest standard arguments -o dev=interface,test=type,enc=component

Table 31-3 sentest Command Line Syntax

Argument 

Explanation 

dev=interface

SEN card device name; the default value is ses0.

test=type

Specifies the test type; select Norm for normal testing or Inter for interactive testing; the default value is Norm. Possible values are: norm and inter.

enc=component

Indicates which part of the enclosure status is reported; the default value is ALL. Possible values are: enalm, dp, dl, pm, fan, ovt, and ALL.

Note -

64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to "32-Bit and 64-Bit Tests".

sentest Error Messages

Table 31-4 sentest Error Messages

Error Message 

Probable Cause(s) 

Recommended Action 

6000

Check alenb failed, exp=value, obs=value

 

 

6001

Check alenb failed, exp=value, obs=value

 

 

6002

Check alenb failed, exp=value, obs=value

 

 

6003

Check altime failed, exp time=value, obs=value

 

 

6004

Fan failed

 

 

6005

Dual fan failed

 

 

6006

Enclosure over temperature

 

 

6007

Device failed, need immediate attention

 

 

6008

Power module A failed

 

 

6009

power module B failed

 

 

8000

power module B failed

 

 

8001

ioctl get state failed, errmsg=message

 

 

8002

ioctl get state failed, errmsg=message