4 Using the External Events Generator

The ADC Tab

The Analog-to-Digital Converter (ADC) tab allows you to test analog input of ADC channels, as shown in Figure 4-3, including Channel, DAC Input, and minimum and maximum values. You can use the slider to set input voltage manually or connect selected DAC output to selected ADC input.

Figure 4-3 The External Events Generator ADC Tab

Description of "Figure 4-3 The External Events Generator ADC Tab"

The GPIO Tab

To generate input events for General Purpose I/O, select the GPIO tab. Here, you can toggle the value of each of the pins from high to low and use a wave generator to simulate a more complex signal to the emulator. The External Events Generator GPIO tab is shown in Figure 4-4.

Figure 4-4 The External Events Generator GPIO Tab

Description of "Figure 4-4 The External Events Generator GPIO Tab"

To toggle a Button value between Low and High, click on the Button.

When a button value has been changed on the External Events Generator GPIO tab, you see a corresponding change to the Value field of the GPIO Pins tab for the EmbeddedDevice1 emulator, as shown in Figure 4-5.

Figure 4-5 The Button Fields of the EmbeddedDevice1 Emulator GPIO Pins Tab

Description of "Figure 4-5 The Button Fields of the EmbeddedDevice1 Emulator GPIO Pins Tab"

The Location Tab

The Location tab of the External Events Generator allows you to test the Location functionality of your device, as shown in Figure 4-6.

The Location tab has the following fields:

• Location Provider. Indicates if the Location Provider is available, temporarily unavailable, or out of service.

• Orientation. Indicates if the Orientation is supported, unsupported, or unavailable. Also allows you to set the Azimuth, Pitch, Roll, and Magnetic Orientation of your device.

• Location. Allows you to specify specific emulation settings for your device, such as Latitude, Longitude, Altitude, Speed, and Course. It also allows you to browse for and run a specified script or demo program to test the Location capabilities of your device. For a specified script, you can set the duration of the run using the Time slider.

Figure 4-6 The External Events Generator Location Tab

Description of "Figure 4-6 The External Events Generator Location Tab"

The MMIO Tab

The Memory Mapped I/O tab of the External Events Generator allows the user to simulate sending input event IDs to different MMIO devices that support events. Currently, only the BIG_ENDIAN_DEVICE supports events. The MMIO tab is shown in Figure 4-7.

Figure 4-7 The External Events Generator MMIO Tab

Description of "Figure 4-7 The External Events Generator MMIO Tab"

The Power Management Tab

The Power Management tab allows you to define power settings for a device battery or external device. The Power Management tab is shown in Figure 4-8.

Figure 4-8 The Power Management Tab

Description of "Figure 4-8 The Power Management Tab"

The Pulse Counter Tab

The Pulse Counter tab allows you to send a sequence of pulses to the pulse counters available in the current embedded devices, as shown in Figure 4-9.

Figure 4-9 The External Events Generator Pulse Counters Tab

Description of "Figure 4-9 The External Events Generator Pulse Counters Tab"

The GPIO Tab

The GPIO tab for the Qualcomm_IoE_Device External Events Generator is similar in function to the GPIO tab in the EmbeddedDevice1 emulator, but has many more buttons available, as shown in Figure 4-10.

Figure 4-10 The Qualcomm_IoE_Device External Events Generator GPIO Tab

Description of "Figure 4-10 The Qualcomm_IoE_Device External Events Generator GPIO Tab"

To toggle a Button value between Low and High, click on the Button.

When a button value has been changed on the External Events Generator GPIO tab, you see a corresponding change to the Value field of the GPIO Pins tab for the Qualcomm_IoE_Device emulator, as shown in Figure 4-11.

Figure 4-11 The GPIO Pins Tab of the Qualcomm_IoE_Device Emulator

Description of "Figure 4-11 The GPIO Pins Tab of the Qualcomm_IoE_Device Emulator"

The Inter-Integrated Circuit (I2C) Tab

The Inter-Integrated Circuit (I2C) tab displays information for a selected slave device, and data sent to and received from a master device.

The three sample sensors in the I2C tab are:

• G-Sensor. Operates in the same way as described in the External Events Generator SPI tab. However, the sample IMLet reads the accelerometer values through the I2C interface. For more information, see "The Serial Peripheral Interface (SPI) Tab."

• Light Sensor. Allows the user to test three kinds of light sensing: ambient light, proximity, and Infrared (IR). A lux value can be specified, and the values changed within the lux value range by moving the Light slider.

• Temperature Sensor. High and Low temperature values can be set, and temperature values read when the slider is moved.

The Qualcomm_IoE_Device emulator External Events Generator I2C tab is shown in Figure 4-12.

Figure 4-12 The Qualcomm_IoE_Device External Events Generator I2C Tab

Description of "Figure 4-12 The Qualcomm_IoE_Device External Events Generator I2C Tab"

The Pulse Counters Tab

The Pulse Counters tab of the Qualcomm_IoE_Device External Events Generator works the same as the tab in the External Events Generator for the EmbeddedDevice1. However, in the Qualcomm_IoE_Device tab there is only one counter, as shown in Figure 4-13.

Figure 4-13 The Qualcomm_IoE_Device External Events Generator Pulse Counters Tab

Description of "Figure 4-13 The Qualcomm_IoE_Device External Events Generator Pulse Counters Tab"

The Serial Peripheral Interface (SPI) Tab

The Qualcomm_IoE_Device emulator External Events Generator SPI tab provides a sample accelerometer sensor, G-Sensor, as shown in Figure 4-14.

Figure 4-14 The Qualcomm_IoE_Device External Events Generator SPI Tab

Description of "Figure 4-14 The Qualcomm_IoE_Device External Events Generator SPI Tab"

The G-Sensor sample allows an IMlet to read accelerometer values from the emulator through the Serial Peripheral Interface. Move the slider of the X, Y, and Z acceleration scale to change the x, y, and z values transmitted over SPI. The minimum and maximum values for the sliders in the G-Sensor are defined by the Java ME application.

The G-Sensor sample duplicates in emulation the functionality of the digital, triaxial acceleration sensor on the Qualcomm Orion IoE embedded device. The acceleration sensor is used to sense tilt, motion, and shock vibration in embedded devices, such as medical instruments, computer peripherals, and monitoring devices.