SunVTS 6.3 Test Reference Manual for SPARC Platforms Table Of ContentsPrevious ChapterNext ChapterBook Index


C H A P T E R  28
Integer Unit Test (iutest)

iutest Description

The Integer Unit Test (iutest) tests the resident integer unit in Sun SPARC CPUs. It exercises all of the register windows present in the integer unit of the CPU. The successful completion of the test implies that all of the register windows are functioning properly and failure implies a faulty register.

iutest Options

To reach the following dialog box, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups, or your system might not include the device appropriate to this test. Refer to the SunVTS User's Guide for more details.


FIGURE 28-1 iutest Test Parameter Options Dialog Box

Screenshot of the iutest Test Parameter Options dialog box


Test Depth is the only required test option. Test Depth corresponds to the number of times that all the register windows are getting tested. The default, maximum, and minimum values of the Test Depth are 8, 64, and 1 respectively.

iutest Test Modes


TABLE 28-1 iutest Supported Test Modes

Test Mode

Description

Connection

Displays the type of CPU implementation (for example, sparcv7 or sparcv9, etc.), the operating frequency, and CPU status (online, offline, and so on).

Functional

Verifies all of the register windows and returns the appropriate error message if there is a faulty register. Otherwise, displays a successful test message.


iutest Command-Line Syntax

/opt/SUNWvts/bin/iutest standard_arguments -o depth=val,dev=cpu-unitN

TABLE 28-2 describes the iutest command-line syntax.


TABLE 28-2 iutest Command-Line Syntax

Command

Description

depth=val

Specifies the value for the depth option. val is the value of the Test_Depth parameter option as described in the preceding iutest Options section.

dev=cpu-unitN

Specifies the device to test. N is the CPU unit number (0,1,2, and so on).


The test behavior is unpredictable if options other than those described in this section are entered.



  SunVTS 6.3 Test Reference Manual for SPARC Platforms 820-0081-10 Table Of ContentsPrevious ChapterNext ChapterBook Index


Copyright © 2007, Sun Microsystems, Inc. All Rights Reserved.