| Sun Fire V20z and Sun Fire V40z Servers Troubleshooting Techniques and Diagnostics Guide |    
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| Sun Fire V20z and Sun Fire V40z Servers Troubleshooting Techniques and Diagnostics Guide |
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| A P P E N D I X A |
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Diags Test Results |
This section provides additional details about the diagnostics tests that might help to determine the cause of the problems. The details include annotated output of the tests, descriptions of the test algorithms, possible test failure cases, and additional troubleshooting suggestions.
This appendix describes the steps that a diagnostics test performs, and the components that might trigger a failure.
The voltage limits test verifies that each voltage is within the high and low limits that are defined for that voltage.
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Note - If a given voltage supports trimming, the trimming function is exercised. |
The voltage trim failure criteria is plus or minus 2 percent from the reading at nominal trim, with the exception of the low trim on the Bulk 3.3V S5 which is trimHi > trimNom > trimLo.
The limits test reads the initial trim setting that is associated with the voltage that is tested, before it reads the voltage from the analog-to-digital conversion (ADC).
If the voltage is within limits, the diagnostic reads the voltage again, with the trim set to nominal, then high, and finally low, and saves the value of each reading as a variable. The actual codes for nominal, low, and high settings vary among VRMs, the CPUs and the power supplies.
If the nominal values of the monitored voltages is greater than 2.0 volts each, they are normalized to 2.0 volts by a divider network, before they are applied to the inputs of the ADC. The input range of the ADC is 0.0 to 2.5 Volts. The voltage calculation is:
Voltage = reading * 2.5 / 4096
The result then is scaled, based on the nominal voltage of the net that is tested. For example,for VCC_120_S0 (12 volts); the voltage (V) would be multiplied by 6.0. (The voltage was divided by 6 in the divider network to obtain the nominal 2.0 volts input.)
The voltage is read 5 (five) times and the result is the average of the 5 (five) readings.
limits.bulk.v2_5-s0 88 Passed
Test Details:
Actual: 2.485
Nominal: 2.500
Maximum Limit: 2.625
Minimum Limit: 2.375
Sensor: Bulk 2.5V S0 voltage (ID=bulk.v2_5-s0)
Component(s): Motherboard (ID=planar.vpd)
limits.bulk.v3_3-s0 91 Passed
Test Details:
Actual Trim High: 3.400
Actual Trim Nominal: 3.321
Actual Trim Low:: 3.237
Nominal: 3.300
Maximum Limit: 3.465
Minimum Limit: 3.135
Sensor: Bulk 3.3V S0 voltage (ID=bulk.v3_3-s0)
Component(s): Motherboard (ID=planar.vpd)
limits.bulk.v1_8-s5 46 FAILED
Failure Details:
Failure: Voltage exceeds maximum limit.
Actual: 1.932
Nominal: 1.800
Maximum Limit: 1.890
Minimum Limit: 1.710
Sensor: Bulk 1.8V S5 voltage (ID=bulk.v1_8-s5)
Component(s): Motherboard (ID=planar.vpd)
limits.bulk.v1_8-s5 46 FAILED
Failure Details:
Failure: Unable to set voltage trim. No such device or address.
Sensor: Bulk 1.8V S5 voltage (ID=bulk.v1_8-s5)
Component(s): Motherboard (ID=planar.vpd)
This test verifies that the maximum speed of the fan is within spec and that the fan speed can be controlled.
At the start of the test, all fans are set to full on. This bypasses the internal control loop to drive the fans to full speed as rapidly as possible. When the fans have settled at the target speed for 24 seconds, the maximum speed is recorded. Next, the fans are set to run at the low speed. When the fans have settled at the target speed for 24 seconds, the low speed is recorded. The speed readings are compared to the upper and lower limits, to determine if the test failed.
The fans sometimes will approach the set-point asymptotically and hover slightly outside of the desired range. The tandem fans (fan0,1 fan2,3 fan 4,5) exhibit a characteristic increase in speed on the order of 1000 RPM in the downwind fan (fans1,3,5). Each fan controller has an internal clock that is specified at +/-(plus or minus) 10 percent, plus variations for temperature and voltage.
The allowable tolerances for determination of pass/fail currently allow a deviation of -10/+35% (minus 10 to plus 35 percent) for the high limits and -/+15% (minus 15 to plus 15 percent) for the low limits.
Before it manipulates the fan controller, the test saves the initial state of the fan controller, in order to restore this initial state after completion of the test.
Each controller manages two fans, a primary and a secondary. Each fan has a tachometer output that produces 2 (two) pulses-per-revolution. The master fan's tachometer output (tach0) is the feedback signal for the internal control loop of the controller. The slave fan's tachometer output (tach1) is used only for reading the speed of the slave fan. The controller supports open loop or closed-loop operation, as well as full on and off control.
All results are from a Sun Fire V40z Server. A Sun Fire V20z Server has similar output, with fewer fan groups.
speed.allFans 2 Passed
Test Details:
fan1.tach Passed
Controller: fan-ctrl2
High Rated: 8000
High Actual: 7920
High Delta: -1.01%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6098
Low Actual: 6780
Low Delta: 10.05%
Low Limits: -/+15%
Sensor: Fan 1 measured speed (ID=fan1.tach)
Component(s): Fan 1 (ID=NA)
fan2.tach Passed
Controller: fan-ctrl2
High Rated: 8000
High Actual: 8580
High Delta: +6.76%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6607
Low Actual: 7320
Low Delta: 9.75%
Low Limits: -/+15%
Sensor: Fan 2 measured speed (ID=fan2.tach)
Component(s): Fan 2 (ID=NA)
fan3.tach Passed
Controller: fan-ctrl3
High Rated: 8000
High Actual: 8100
High Delta: +1.23%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6237
Low Actual: 6900
Low Delta: 9.61%
Low Limits: -/+15%
Sensor: Fan 3 measured speed (ID=fan3.tach)
Component(s): Fan 3 (ID=NA)
fan4.tach Passed
Controller: fan-ctrl3
High Rated: 8000
High Actual: 8760
High Delta: +8.68%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6745
Low Actual: 7320
Low Delta: 7.85%
Low Limits: -/+15%
Sensor: Fan 4 measured speed (ID=fan4.tach)
Component(s): Fan 4 (ID=NA)
speed.allFans 1 FAILED
Failure Details:
fan1.tach FAILED
Failure: fan1 is excessively fast at high speed setting; inlet air path may be obstructed.
Controller: fan-ctrl2
High Rated: 8000
High Actual: 10900
High Delta: +36.25%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6329
Low Actual: 6900
Low Delta: 8.27%
Low Limits: -/+15%
Sensor: Fan 1 measured speed (ID=fan1.tach)
Component(s): Fan 1 (ID=NA)
speed.allFans 2 FAILED
Test Details:
fan1.tach FAILED
Failure: fan1 is too fast at low setting.
Controller: fan-ctrl2
High Rated: 8000
High Actual: 7920
High Delta: -1.01%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6098
Low Actual: 7200
Low Delta: 16.88%
Low Limits: -/+15%
Sensor: Fan 1 measured speed (ID=fan1.tach)
Component(s): Fan 1 (ID=NA)
speed.allFans 1 FAILED
Failure Details:
fan1.tach FAILED
Failure: fan1 is too slow at low setting.
Controller: fan-ctrl2
High Rated: 8000
High Actual: 8760
High Delta: +8.68%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6329
Low Actual: 5200
Low Delta: -18.46%
Low Limits: -/+15%
Sensor: Fan 1 measured speed (ID=fan1.tach)
Component(s): Fan 1 (ID=NA)
speed.allFans 2 FAILED
Failure Details:
fan1.tach FAILED
Failure: fan1 is too slow at high setting.
Controller: fan-ctrl2
High Rated: 8000
High Actual: 7000
High Delta: -14.28%
High Limits: -10/+35%
Low Setpoint: 6160
Low Expected: 6098
Low Actual: 6780
Low Delta: 10.05%
Low Limits: -/+15%
Sensor: Fan 1 measured speed (ID=fan1.tach)
Component(s): Fan 1 (ID=NA)
The memory tests are implemented as a loadable kernel module and a user-space component. The kernel module implements ioctl functions that actually perform most of the tests.
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Note - For versions earlier than 2.x.x.x, ensure that interleaving is disabled in BIOS setup before you run the memory tests. For 2.x.x.x and higher versions, do not disable interleaving in BIOS. |
Data is written to memory from bottom to top. First it writes all 0x0. Then, as it reads and checks the 0x0, it writes 0x5. As it reads and checks the 0x5, it writes 0x0. Then it starts reading from the top, moving toward the bottom. As it reads and checks for 0x0, it writes 0x5. As it reads and checks 0x5, it writes 0x0. Then it reads and checks the 0x0. This entire process is repeated, but 0x5 is replaced with 0xa.
Data is written to memory starting from the bottom, moving toward the top. The location of the memory data is written in the address space. Then, the test performs a random check on an address space. If the space does not contain data that is the same as the address, the test fails.
Data is written to memory starting from the bottom, moving toward the top. The test fills the memory, alternating between 0x5 and 0xa, to achieve a checkerboard layout in memory. It pauses for 100 ms, then reads and checks the memory for 0x5 and 0xa.
march.allDimms PF3 Passed
Test Details:
Memory Configuration: Total: 3072Mb
CPU0-1024Mb CPU1-2048Mb
CPU0: Width[128] Addr 0 - 3fffffff
DIMM 0 256Mb Addr 0000000000 - 001fffffff Even Quad Word
DIMM 1 256Mb Addr 0000000000 - 001fffffff Odd Quad Word
DIMM 2 256Mb Addr 0020000000 - 003fffffff Even Quad Word
DIMM 3 256Mb Addr 0020000000 - 003fffffff Odd Quad Word
randaddr.allDimms PF4 Passed
Test Details:
Memory Configuration: Total: 3072Mb
CPU0-1024Mb CPU1-2048Mb
CPU0: Width[128] Addr 0 - 3fffffff
DIMM 0 256Mb Addr 0000000000 - 001fffffff Even Quad Word
DIMM 1 256Mb Addr 0000000000 - 001fffffff Odd Quad Word
DIMM 2 256Mb Addr 0020000000 - 003fffffff Even Quad Word
DIMM 3 256Mb Addr 0020000000 - 003fffffff Odd Quad Word
retention.allDimms PF5 Passed
Test Details:
Memory Configuration: Total: 3072Mb
CPU0-1024Mb CPU1-2048Mb
CPU0: Width[128] Addr 0 - 3fffffff
DIMM 0 256Mb Addr 0000000000 - 001fffffff Even Quad Word
DIMM 1 256Mb Addr 0000000000 - 001fffffff Odd Quad Word
DIMM 2 256Mb Addr 0020000000 - 003fffffff Even Quad Word
DIMM 3 256Mb Addr 0020000000 - 003fffffff Odd Quad Word
retention.allDimms PF1 FAILED
Failure Details:
Failure: Unable to load services.
march.allDimms 1 FAILED
Test Details:
Failure: ECC ERROR @ Address:0x01a000e700:CPU1, DIMM - 2
CPU 1 DIMM 2 (ID=cpu1.mem2.vpd)
Correctable, Syndrome 0x18, Multiple Errors Occurred
CPU1 Function 3 ECC Registers:
00 MCA NB STAT LOW: 85080a13 MCA NB STAT HIGH: 85080a13
Memory Configuration: Total: 7680Mb
CPU0-2560Mb CPU1-5120Mb
CPU0: Width[128] Addr 0 - 9fffffff
DIMM 0 0256Mb Addr 0080000000 - 009fffffff Even Quad Word
DIMM 1 256Mb Addr 0080000000 - 009fffffff Odd Quad Word
DIMM 2 1024Mb Addr 0000000000 - 007fffffff Even Quad Word
DIMM 3 1024Mb Addr 0000000000 - 007fffffff Odd Quad Word
CPU1: Width[128] Addr a0000000 - 1dfffffff
DIMM 0 2048Mb Addr 00a0000000 - 019fffffff Even Quad Word
DIMM 1 2048Mb Addr 00a0000000 - 019fffffff Odd Quad Word
*DIMM 2 512Mb Addr 01a0000000 - 01dfffffff Even Quad Word
DIMM 3 512Mb Addr 01a0000000 - 01dfffffff Odd Quad Word
march.allDimms 1 FAILED
Test Details:
Failure: Need to disable interleaving in BIOS setup before running memory tests.
Data Comparison Failure
march.allDimms 1 FAILED
Test Details:
Failure: Data Miscompare @ Addr 0x1a0000008, CPU 1 DIMM 3
Expected : [5555555555555555]
Observed : [5555555555505555]
Difference : [50000]
Memory Configuration: Total: 7168Mb
CPU0-2560Mb CPU1-4608Mb
CPU0: Width[128] Addr 0 - 9fffffff
DIMM 0 256Mb Addr 0080000000 - 009fffffff Even Quad Word
DIMM 1 256Mb Addr 0080000000 - 009fffffff Odd Quad Word
DIMM 2 1024Mb Addr 0000000000 - 007fffffff Even Quad Word
DIMM 3 1024Mb Addr 0000000000 - 007fffffff Odd Quad Word
CPU1: Width[128] Addr a0000000 - 1bfffffff
DIMM 0 2048Mb Addr 00a0000000 - 019fffffff Even Quad Word
DIMM 1 2048Mb Addr 00a0000000 - 019fffffff Odd Quad Word
DIMM 2 256Mb Addr 01a0000000 - 01bfffffff Even Quad Word
*DIMM 3 256Mb Addr 01a0000000 - 01bfffffff Odd Quad Word
randaddr.allDimms 2 Passed
Test Details:
Memory Configuration: Total: 7168Mb
CPU0-2560Mb CPU1-4608Mb
CPU0: Width[128] Addr 0 - 9fffffff
DIMM 0 256Mb Addr 0080000000 - 009fffffff Even Quad Word
DIMM 1 256Mb Addr 0080000000 - 009fffffff Odd Quad Word
DIMM 2 1024Mb Addr 0000000000 - 007fffffff Even Quad Word
DIMM 3 1024Mb Addr 0000000000 - 007fffffff Odd Quad Word
CPU1: Width[128] Addr a0000000 - 1bfffffff
DIMM 0 2048Mb Addr 00a0000000 - 019fffffff Even Quad Word
DIMM 1 2048Mb Addr 00a0000000 - 019fffffff Odd Quad Word
DIMM 2 256Mb Addr 01a0000000 - 01bfffffff Even Quad Word
DIMM 3 256Mb Addr 01a0000000 - 01bfffffff Odd Quad Word
retention.allDimms 3 FAILED
Test Details:
Failure: Data Miscompare @ Addr 0x1a0000008, CPU 1 DIMM 3
Expected : [5555555555555555]
Observed : [5555555555505555]
Difference : [50000]
Memory Configuration: Total: 7168Mb
CPU0-2560Mb CPU1-4608Mb
CPU0: Width[128] Addr 0 - 9fffffff
DIMM 0 256Mb Addr 0080000000 - 009fffffff Even Quad Word
DIMM 1 256Mb Addr 0080000000 - 009fffffff Odd Quad Word
DIMM 2 1024Mb Addr 0000000000 - 007fffffff Even Quad Word
DIMM 3 1024Mb Addr 0000000000 - 007fffffff Odd Quad Word
CPU1: Width[128] Addr a0000000 - 1bfffffff
DIMM 0 2048Mb Addr 00a0000000 - 019fffffff Even Quad Word
DIMM 1 2048Mb Addr 00a0000000 - 019fffffff Odd Quad Word
DIMM 2 256Mb Addr 01a0000000 - 01bfffffff Even Quad Word
*DIMM 3 256Mb Addr 01a0000000 - 01bfffffff Odd Quad Word
The NIC phyLoop test performs a loopback test at the PHY. To accomplish this, the test sets the PHY loopback mode in the NIC device driver, initializes a 1500-byte data buffer with an incrementing byte pattern [0x00,0x01,0x02...0xff], and writes the data to the NIC. Next, the test initializes a second buffer with a fixed 0xe5 pattern and read 1500 bytes from the NIC. The test compares the data that is written from that read. Finally, the test sets the loopback mode off.
phyLoop.Nic.0 PF1 Passed
Test Details:
Component(s): Motherboard (ID=planar.vpd)
phyLoop.Nic.1 PF2 Passed
Test Details:
Component(s): Motherboard (ID=planar.vpd)
Unable to load the driver bcm5700.
phyLoop.Nic.0 PF1 FAILED
Failure Details:
Failure: Unable to load service.
Component(s): Motherboard (ID=planar.vpd)
The link status of the device is down.
phyLoop.Nic.0 PF1 FAILED
Failure Details:
Failure: Link is down.
Component(s): Motherboard (ID=planar.vpd)
The link status of the device is mismatched.
phyLoop.Nic.0 PF1 FAILED
Failure Details:
Failure: Link setting mismatch.
Component(s): Motherboard (ID=planar.vpd)
The link status of the device is unknown.
phyLoop.Nic.0 PF1 FAILED
Failure Details:
Failure: Link status unknown.
Component(s): Motherboard (ID=planar.vpd)
The loopback is off.
phyLoop.Nic.0 PF1 FAILED
Failure Details:
Failure: Loopback is off.
Component(s): Motherboard (ID=planar.vpd)
Unable to write to loopback device.
phyLoop.Nic.0 PF1 FAILED
Failure Details:
Failure: Write error. Tried to write <X> bytes, only wrote <Y>.
Component(s): Motherboard (ID=planar.vpd)
Unable to read the loopback device.
phyLoop.Nic.0 PF1 FAILED
Failure Details:
Failure: Read error. Tried to read <X> bytes, only read <Y>.
Component(s): Motherboard (ID=planar.vpd)
A reading from the device is different from what was just written. The offset of the failure is the hex offset from the beginning of the data buffer. Expected and actual are the first hex byte that mismatched.
phyLoop.Nic.1 PF2 FAILED
Failure Details:
Failure: Compare error. At offset 343 expected 43, got bc.
Component(s): Motherboard (ID=planar.vpd)
The storage tests issue self-test commands to SCSI devices. There are both long and short forms of the self-test command. The execution time of the tests is a function of the device itself.
If the device is present, a SCSI subsystem control block that contains either the short or the long form of the Send Diagnostic command is passed to the SCSI driver for execution.
long.SCSI_0 PF1 Passed
Test Details:
Device: SEAGATE ST336607LC
Version: 0004
Serial number: 3JA0KJF6000073248EGM
Device type: disk
Component(s): Hard disk drive 0 (ID=NA)
The device does not recognize the self-test command.
short.SCSI_1 PF2 FAILED
Failure Details:
Failure: Error starting DST background short test: Illegal Request
Component(s): Hard disk drive 1 (ID=NA)
The device is unable to accept and process self-test commands. The output includes the SCSI sense key.
short.SCSI_1 PF2 FAILED
Failure Details:
Failure: SCSI command failed: Sense Key[3]: Not Ready
Component(s): Hard disk drive 1 (ID=NA)
The following is the list of sense keys.
No Sense
Recovery Data
Not Ready
Medium Error
Hardware Error
Illegal Request
Unit Attention
Data Protect
Blank Check
Vendor Specific
Copy Aborted
Volume Overflow
Miscompare
Reserved
The self-test command fails. The "Address of first failure" represents which segment of the vendor's test failed.
short.SCSI_1 PF2 FAILED
Failure Details:
Failure: Test failed (Failing segment) Address of first failure{0x0).
Component(s): Hard disk drive 1 (ID=NA)
This self-test command returned garbage.
short.SCSI_1 PF2 FAILED
Failure Details:
Failure: Invalid Self-Test Results Page Returned by System.
Component(s): Hard disk drive 1 (ID=NA)
The flash memory diagnostic verifies that the SP flash memory can be written. Each iteration of the diagnostic flips 2 bits (1 in each chip) from their initial erased state (1) to a 0. Eventually, all of the "1" bits in the diagnostic area of the flash are "used up" and the diagnostic sector of the flash is erased during the test, before it writes the 2 bits.
Most of the possible failures are related to difficulties accessing the flash part through the MTD driver. These are unlikely to occur and most likely point to a software problem. If these persist, the first attempt at remediation is to erase and re-program the entire flash of the Service Processor. See the Systems Management Guide for information about how to update the Service Processor.
write.flash 2 Passed
Test Details:
Component(s): Motherboard (ID=planar.vpd)
Unable to open the flash sector for read/write access.
write.flash 1 FAILED
Failure Details:
Failure: Unable to open flash driver: <errno string>
Component(s): Motherboard (ID=planar.vpd)
Unable to read the flash sector.
write.flash 1 FAILED
Failure Details:
Failure: Unable to read flash memory: <errno string>
Component(s): Motherboard (ID=planar.vpd)
Unable to determine the size of the flash sector.
write.flash 1 FAILED
Failure Details:
Failure: Can't determine erase size of device: <errno string>
Component(s): Motherboard (ID=planar.vpd)
Unable to write to the flash sector.
write.flash 1 FAILED
Failure Details:
Failure: Unable to write flash memory: <errno string>
Component(s): Motherboard (ID=planar.vpd)
Unable to erase the flash sector. This error could indicate a defective part or other hardware error.
write.flash 1 FAILED
Failure Details:
Failure: Erase operation failure: <errno string>
Component(s): Motherboard (ID=planar.vpd)
The magic number at offset 0x0 of the flash reserved partition is not correct. Expected value is 0x44494147 or 0xffffffff (erased). This could indicate that some process inadvertently wrote to the diagnostics area. Re-flash the Service Processor and re-test. See the Systems Management Guide for information about how to update the Service Processor.
write.flash 1 FAILED
Failure Details:
Failure: Magic number of diagnostics area incorrect, Expected [0x44494147], Actual [0xNNNNNNNN].
Component(s): Motherboard (ID=planar.vpd)
A reading of the flash sector is different from what was just written. This is probably a hardware failure. Re-flash the Service Processor and re-test. See the Systems Management Guide for information about how to update the Service Processor.
write.flash 1 FAILED
Failure Details:
Failure: Data Miscompare: Expected [0xNNNNNNNN], Actual [0xNNNNNNNN].
Component(s): Motherboard (ID=planar.vpd)
This group of tests verifies functionality of the LED drivers. The test consists of reading the bit of interest in the I2C-connected LED driver chip, inverting the value of that bit, writing it to the chip, reading the new value, verifying that it is indeed toggled, writing the initial value and again verifying that it is correct. The LED does not change to indicate this behavior.
The following examples are from a 4300 server. Although a 2100 server has fewer and different LED components, the test output is similar. The examples comprise a condensed version of the report.
toggleLED.allLeds 3 Passed
Test Details:
cd Passed
Sensor: CDROM Light path location LED (ID=cd.lp)
Component(s): CD ROM drive (ID=NA)
cpu0 Passed
Sensor: CPU 0 Light path location LED (ID=cpu0.lp)
Component(s): CPU 0 (ID=cpu0.vpd)
cpu0.mem0 Passed
Sensor: CPU 0 Dimm 0 Light path location LED (ID=cpu0.mem0.lp)
Component(s): CPU 0 DIMM 0 (ID=cpu0.mem0.vpd)
cpu0.mem1 Passed
Sensor: CPU 0 Dimm 1 Light path location LED (ID=cpu0.mem1.lp)
Component(s): CPU 0 DIMM 1 (ID=cpu0.mem1.vpd)
cpu0.mem2 Passed
Sensor: CPU 0 Dimm 2 Light path location LED (ID=cpu0.mem2.lp)
Component(s): CPU 0 DIMM 2 (ID=cpu0.mem2.vpd)
cpu0.mem3 Passed
Sensor: CPU 0 Dimm 3 Light path location LED (ID=cpu0.mem3.lp)
Component(s): CPU 0 DIMM 3 (ID=cpu0.mem3.vpd)
cpu0.memvrm Passed
Sensor: CPU 0 Memory VRM Light path location LED (ID=cpu0.memvrm.lp)
Component(s): CPU 0 memory VRM (ID=cpu0.memvrm.vpd)
cpu0.vrm Passed
Sensor: CPU 0 VRM Light path location LED (ID=cpu0.vrm.lp)
Component(s): CPU 0 VRM (ID=cpu0.vrm.vpd)
cpuplanar Passed
Sensor: Daughtercard Light path location LED (ID=cpuplanar.lp)
Component(s): CPU Daughter Card (ID=cpuplanar.vpd)
fault Passed
Sensor: System Fault Indication (ID=faultswitch)
Component(s): Fault light (ID=NA)
floppy Passed
Sensor: Floppy Light path location LED (ID=floppy.lp)
Component(s): Floppy disk drive (ID=NA)
oppanel Passed
Sensor: LCD Light path location LED (ID=frontpanel.lp)
Component(s): Front panel (ID=pic.vpd)
identify Passed
Sensor: Identify switch (ID=identifyswitch)
Component(s): Identify light (ID=NA)
front-fans Passed
Sensor: Fan Board Light path location LED (ID=pcifan.lp)
Component(s): Front Fan backplane (ID=NA)
planar Passed
Sensor: Motherboard Light path location LED (ID=planar.lp)
Component(s): Motherboard (ID=planar.vpd)
disk-backplane Passed
Sensor: SCSI Backplane Light path location LED (ID=scsibp.lp)
Component(s): SCSI backplane (ID=scsibp.vpd)
toggleLED.allLeds 3 Warning
Test Details:
cd Not Present
Sensor: CDROM Light path location LED (ID=cd.lp)
Component(s): CD ROM drive (ID=NA)
Unable to read the device.
toggleLED.allLeds 3 FAILED
Test Details:
planar FAILED
Failure: Unable to read LED. <errno string>
Sensor: Motherboard Light path location LED (ID=planar.lp)
Component(s): Motherboard (ID=planar.vpd)
Unable to write to the device.
toggleLED.allLeds 3 FAILED
Test Details:
planar FAILED
Failure: Unable to write to LED. <errno string>
Sensor: Motherboard Light path location LED (ID=planar.lp)
Component(s): Motherboard (ID=planar.vpd)
Each temperature sensor is initialized and the current temperature is read from the device. The temperature then is compared against critical and warning thresholds. If a threshold is exceeded, a failure is indicated.
Use the SP command sensor get to view the current threshold settings for a given temperature.
localhost # sensor get -i cpu0.temp -cwWC
Identifier Crit Low Warn Low Warn High Crit High
cpu0.memtemp NA NA 68.00 70.00
If the temperature is within allowable ranges, the reading is displayed in degrees Celsius.
read.cpu0.memtemp 1 Passed
Test Details:
Temperature: 67.3
Sensor: CPU 0 Memory temperature (ID=cpu0.memtemp)
Component(s): Motherboard (ID=planar.vpd)
The temperature reading is either above or below the warning threshold.
read.ambient.temp 2 Passed
Test Details:
Temperature: 26.8
Warning: Temperature exceeds the warning threshold of 22.0, but is still safe.
Sensor: Ambient air temp (ID=ambienttemp)
Component(s): Box (enclosure) (ID=NA)
Read.cpu0.memtemp 1 Warning
Failure Details:
Failure: Device not present.
Sensor: CPU 0 Memory temperature (ID=cpu0.memtemp)
Component(s): Motherboard (ID=planar.vpd)
read.cpu0.memtemp 1 FAILED
Failure Details:
Failure: Unable to read device temperature.
Sensor: CPU 0 Memory temperature (ID=cpu0.memtemp)
Component(s): Motherboard (ID=planar.vpd)
The temperature reading is either above or below the critical threshold.
read.cpu0.temp 2 FAILED
Test Details:
Failure: Sensor is below critical threshold: 29.2 < 30.0
Sensor: CPU 0 temperature (ID=cpu0.dietemp)
Component(s): CPU 0 (ID=cpu0.vpd)
read.cpu1.temp 23 FAILED
Test Details:
Failure: Sensor exceeds critical threshold: 30.0 > 29.2
Sensor: CPU 0 temperature (ID=cpu1.dietemp)
Component(s): CPU 0 (ID=cpu1.vpd)
The Operator Panel test module reads and saves the current contents of the display buffer. Then it performs a write/read/compare of five different data patterns (0xFF 0xAA 0x55 0x66 0x99) to the display buffer. After the test is complete, the initial contents of the display are restored.
write.opPanel 1 Passed
Test Details:
Sensor: Operator Panel virtual device (ID=oppanel)
Component(s): Front panel
Unable to read the display buffer.
write.opPanel 2 FAILED
Failure Details:
Failure: Unable to read OpPanel. <errno string>
Sensor: Operator Panel virtual device (ID=oppanel)
Component(s): Front panel
Unable to write to the display buffer.
write.opPanel 2 FAILED
Failure Details:
Failure: Unable to write to OpPanel. <errno string>
Sensor: Operator Panel virtual device (ID=oppanel)
Component(s): Front panel
Data in the display buffer is different from what was just written.
write.opPanel 2 FAILED
Failure Details:
Failure: Compare failed at line 2, char 12. Expected AA and got 23.
Sensor: Operator Panel virtual device (ID=oppanel)
Component(s): Front panel
The power test module is only available on Sun Fire V40z Servers that have dual power supplies.
The power supply test verifies the presence of each power supply and reads the status register on the power back plane. If a supply is present, the enabled and power good status bits of the PRS are read. The VPD for that supply is read and the checksum is verified. For each supply, a pass status is determined by these criteria:
If supply is not present, absence of alert status or presence of a power good status is considered an error. A missing power supply does not constitute a failure, but is a warning. Power supply status for each power supply is either "Passed," "FAILED," or "Warning." The NPUI (Net Power Usage Indicator) on the power supply motherboard is read to determine the present power consumption of each supply. Each supply produces an output signal. The voltage of this signal is proportional to the power consumption of that supply. This voltage is an input to a PCF8591 dual ADC on the power supply motherboard. The converted value is read from this and used to calculate the power consumption.
read.allPowerSupplies 9 Passed
Test Details:
Power Supply 1 Status: Passed
Presence Detect: Present
Enabled: True
Power Good: True
Part Number: S00440
ECN: A01
Serial Number: PM16768
Manufacturer: CHEROKEE
Date of Manufacture: 12-24-03
Component(s): Power supply 1 (ID=ps1.vpd)
Power Supply 2 Status: Not Present
read.allPowerSupplies 9 FAILED
Failure Details:
Power Supply 1 Status: Power good indicator is false.
Presence Detect: Present
Enabled: True
Power Good: False
Part Number: S00440
ECN: A01
Serial Number: PM16768
Manufacturer: CHEROKEE
Date of Manufacture: 12-24-03
Component(s): Power supply 1 (ID=ps1.vpd)
Power Supply 2 Status: Passed
Presence Detect: Present
Enabled: True
Power Good: True
Part Number: S00440
ECN: A01
Serial Number: PM16769
Manufacturer: CHEROKEE
Date of Manufacture: 12-24-03
Component(s): Power supply 2 (ID=ps2.vpd)
read.allPowerSupplies 9 FAILED
Failure Details:
Failure: Unable to read device. (Power supply 2)
| Sun Fire V20z and Sun Fire V40z Servers Troubleshooting Techniques and Diagnostics Guide | 817-7184-12 |
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