Stress

Runs certain functional mode tests in stress mode, working the selected devices harder than non-stress mode functional testing. 

Note: This option will be removed in a future version of SunVTS. 

Verbose

Displays verbose messages in the SunVTS messages window. 

Core File

When enabled, creates a core file when a test session results in a core dump. 

When Core File is disabled, a core file is not created. Instead, a message is displayed and logged, indicating the signal that caused the failure. 

See "Using the Debugging Features".

Run On Error

When disabled, SunVTS stops testing when an error is encountered.  

When enabled, SunVTS continues to run until the Max errors value is reached. 

Max Passes

Specifies the maximum number of test passes for all selected devices. The default is 0 (zero) which means there is no limit.

Max Errors

(Only enabled when the Run On Error option is enabled) Specifies the maximum number of allowable errors before stopping the test session. The default is 0 (zero) which directs the SunVTS kernel to continue testing in the event of all errors.

Max Time

Specifies the time limit, in minutes, that a test session can run. The default is 0 (zero) which means there is no time limit. 

Delay Time 

Specifies, in seconds, the amount of time to pause between execution of a test. This option results in differing test behavior based on the level for which this option is specified: 

System level--the delay is performed between the execution of all selected tests. 

Group level--the delay is performed between the execution of selected tests in this group. 

Device level--the delay is performed between the execution of the test for this device. 

Select a value from 0 to 60. Zero (0), the default, performs no delay. 

This option offers testing convenience for tests such as graphic device tests, where adding a delay between test execution provides a period of time for you make selections in the SunVTS main window. 

Number of Instances

Specifies the number of instances to run each scalable test.