ffbtest Command-Line Syntax
/opt/SUNWvts/bin/ffbtest standard_arguments -o dev=device_name, S=subtest_number,F=#_of_subtest_loops,B=#_of_test_loops,P=test_pattern
Table 25-3
ffbtest Command-Line
Syntax
Argument
|
Description
|
dev=device_name
|
device_name is the relative path name of the device being tested with respect to /dev/fbs; The default is ffb0.
|
S=subtest_number
|
subtest_number is the test number of the subtest to be run. Select from the subtests below. You can run multiple subtests by adding the subtest numbers. For example, n=0x3 runs both test 1 and test 2; n=0x180 runs both test 0x080 and test 0x0100. Note that you do not need the leading zeros.
-
n=0x00001 3DRAM
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n=0x00002 3DRAM Logic
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n=0x00004 RAMDAC
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n=0x00008 Rendering Pipeline
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n=0x00010 FastFill/Vertical Scroll
-
n=0x00020 Pixel Processor
-
n=0x00040 Picking
-
n=0x00080 Arbitration
-
n=0x00100 Stereo
More than one test can be selected by ORing subtest numbers. For example: n
= 0x00009 selects 3DRAM and Rendering Pipeline tests. A hex number must be preceded by 0x, decimal numbers are also acceptable.
|
F=#_of_subtest_loops
|
Specifies the number of times to repeat each subtest. The default is 1.
|
B=#_of_test_loops
|
Specifies the number of times to repeat a test loop before passing. The default is 1.
|
P=test_pattern
|
Specifies the test pattern number. The default is r, for random patterns. You may also choose 0 for 0x0000000, 3 for 0x3333333, 5 for 0x5555555, or 9 for 0x9999999.
|
Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to "32-Bit and 64-Bit Tests".
Note - Errors returned by ffbtest are nonspecific. It is not possible to determine which component caused a failure. In all error conditions, the field replaceable unit (FRU) is the entire FFB.