SunVTS 5.0 Test Reference Manual

tcxtest Command-Line Syntax

/opt/SUNWvts/bin/tcxtest standard_arguments -o dev=device_name,lock=E(nable)|D(isable), X=bit_mode,T=test,S=[dfb8, dfb24, dfb32]

Table 58-3 tcxtest Command-Line Syntax

Argument 

Explanation 

dev=device_name

Specifies the filename of the device to be tested, for example, dev=tcx0.

lock= E(nable)|D(isable)

Enables or disables the window system locking option. See "Testing Frame Buffers" for details. Do not use when device is the window system display.

X=bit_mode

Specifies the data transfer size. Supported values are: 

  • 8 byte

  • 16 short

  • 32 long

  • 64 double word

T=test

Specifies a particular test. To specify an individual test, replace test with:

  • a =Address

  • c =Constant

  • r =Random

  • b =Blit

  • s =Stipple

  • h =Cursor

  • w =WRC

 

Note: When you select either the Blit or Stipple test, both the User and Raw mode tests are run.

S=[dfb8, dfb24, dfb32]

Specifies which frame buffer memory space to use. 

  • -dfb8 --Dumb frame buffer 8-bit space. Memory is accessed only by bytes.

  • -dfb24 --Dumb frame buffer 24-bit space. Memory is accessed only by 24-bit reads and writes.

  • -dfb32 --Dumb frame buffer 8-bit space. Memory is accessed by 8-bit reads and writes.


Note -

64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to "32-Bit and 64-Bit Tests".