/opt/SUNWvts/bin/tcxtest standard_arguments -o dev=device_name,lock=E(nable)|D(isable), X=bit_mode,T=test,S=[dfb8, dfb24, dfb32]
Table 58-3 tcxtest Command-Line Syntax
Argument |
Explanation |
---|---|
dev=device_name |
Specifies the filename of the device to be tested, for example, dev=tcx0. |
lock= E(nable)|D(isable) |
Enables or disables the window system locking option. See "Testing Frame Buffers" for details. Do not use when device is the window system display. |
X=bit_mode |
Specifies the data transfer size. Supported values are:
|
T=test |
Specifies a particular test. To specify an individual test, replace test with:
Note: When you select either the Blit or Stipple test, both the User and Raw mode tests are run. |
S=[dfb8, dfb24, dfb32] |
Specifies which frame buffer memory space to use.
|
64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to "32-Bit and 64-Bit Tests".