Using Process Capability
Process capability indices are industrial-accepted calculations for comparing the process output to defined specification limits. For a normal distribution, the process output is defined as :
standard deviations from the mean. For non-normal distributions, Quality determines the Best-Fit Pearson distribution and calculates equivalent 99.73 percent deviations (at 0.00135 and 0.99865).
The following table shows equations that relate to process capability:
| Equation | Statistic |
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The process potential is the ratio of the process distribution to specification limits. It is the potential capability if the process was perfectly centered. This equation requires both upper and lower specifications. |
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This equation represents the actual process capability. These equations account for shifts in the process center. The is the lower of the or values, or worst-case capability. In the case of a unilateral specification, the is set to the calculated or value. |
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The lower process capability represents the process's ability to perform at the LSL. This equation requires an LSL. |
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The upper process capability represents the process's ability to perform at the USL. This equation requires a USL. |
where: |
The 90 percent confident Cpk is an adjusted Cpk based on a 90 percent confidence. The result is heavily affected by the sample size. The larger the sample size, the closer the computed value is to the actual Cpk. See References. |
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The capability ratio is the percentage that the process distribution consumes of the specification. This equation requires both upper and lower specifications. |
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where: is the area under the curve from the mean to the LSL. |
The percent below specification is the estimated area under the curve to the left of the LSL. This equation requires an LSL. |
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where: is the area under the curve from the mean to the LSL. |
The percent above specification is the estimated area under the curve to the right of the USL. This equation requires a USL. |
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The total percent out of specification is the total estimated area under the curve outside of the specification limits. |