CDE Test Mode Region

The buttons in this region control the SunVTS test mode (Figure 4-16):

• Connection test mode--provides a low-stress, quick testing of the availability and connectivity of selected devices. These tests are non-intrusive, meaning that they will release the devices after a quick test, and they will not place a heavy load on system activity.

• Functional test mode--provides more robust testing of your system and devices. It will use your system resources for thorough testing and it assumes that there are no other applications running.

Functional mode, when executed from SyMON, invokes non-intrusive tests that do not significantly affect other applications.

For more information about test modes refer to "Test Modes".

Figure 4-16 CDE Test Mode Selection Region